A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation

Dana Hughes, Reza Zoughi. A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation. IEEE T. Instrumentation and Measurement, 54(6):2398-2401, 2005. [doi]

Abstract

Abstract is missing.