Yoonjong Huh, Yungkwon Sung, Sung-Mo Kang. A study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits. J. Solid-State Circuits, 33(6):921-927, 1998. [doi]
@article{HuhSK98,
title = {A study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits},
author = {Yoonjong Huh and Yungkwon Sung and Sung-Mo Kang},
year = {1998},
doi = {10.1109/4.678661},
url = {https://doi.org/10.1109/4.678661},
researchr = {https://researchr.org/publication/HuhSK98},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {33},
number = {6},
pages = {921-927},
}