Yawei Hui, Byung-Hoon Park, Christian Engelmann. A Comprehensive Informative Metric for Analyzing HPC System Status Using the LogSCAN Platform. In IEEE/ACM 8th Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS@SC 2018, Dallas, TX, USA, November 16, 2018. pages 29-38, IEEE, 2018. [doi]
@inproceedings{HuiPE18,
title = {A Comprehensive Informative Metric for Analyzing HPC System Status Using the LogSCAN Platform},
author = {Yawei Hui and Byung-Hoon Park and Christian Engelmann},
year = {2018},
doi = {10.1109/FTXS.2018.00007},
url = {http://doi.ieeecomputersociety.org/10.1109/FTXS.2018.00007},
researchr = {https://researchr.org/publication/HuiPE18},
cites = {0},
citedby = {0},
pages = {29-38},
booktitle = {IEEE/ACM 8th Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS@SC 2018, Dallas, TX, USA, November 16, 2018},
publisher = {IEEE},
isbn = {978-1-7281-0222-1},
}