Leendert M. Huisman. Diagnosing arbitrary defects in logic designs using single location at a time (SLAT). IEEE Trans. on CAD of Integrated Circuits and Systems, 23(1):91-101, 2004. [doi]
@article{Huisman04,
title = {Diagnosing arbitrary defects in logic designs using single location at a time (SLAT)},
author = {Leendert M. Huisman},
year = {2004},
doi = {10.1109/TCAD.2003.816206},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2003.816206},
tags = {logic},
researchr = {https://researchr.org/publication/Huisman04},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {23},
number = {1},
pages = {91-101},
}