Leendert M. Huisman, Larry Carter, Tom W. Williams. TRIM : Testability Range by Ignoring the Memory. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 474-479, IEEE Computer Society, 1986.
@inproceedings{HuismanCW86,
title = {TRIM : Testability Range by Ignoring the Memory},
author = {Leendert M. Huisman and Larry Carter and Tom W. Williams},
year = {1986},
tags = {testing},
researchr = {https://researchr.org/publication/HuismanCW86},
cites = {0},
citedby = {0},
pages = {474-479},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}