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Leendert M. Huisman, Larry Carter, Tom W. Williams. TRIM : Testability Range by Ignoring the Memory. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 474-479, IEEE Computer Society, 1986.
Possibly Related PublicationsThe following publications are possibly variants of this publication: TRIM: testability range by ignoring the memoryLarry Carter, Leendert M. Huisman, Tom W. Williams. tcad, 7(1):38-49, 1988. [doi]
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