Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits - researchr publication authors

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Jason P. Hurst, Nick Kanopoulos. Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 346-352, IEEE Computer Society, 1995. [doi]

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