Tanvir Hussain, Georg Frey. UML-based Development Process for IEC 61499 with Automatic Test-case Generation. In Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2006, September 20-22, 2006, Diplomat Hotel Prague, Czech Republic. pages 1277-1284, IEEE, 2006. [doi]
@inproceedings{HussainF06,
title = {UML-based Development Process for IEC 61499 with Automatic Test-case Generation},
author = {Tanvir Hussain and Georg Frey},
year = {2006},
doi = {10.1109/ETFA.2006.355407},
url = {http://dx.doi.org/10.1109/ETFA.2006.355407},
tags = {rule-based, testing, UML},
researchr = {https://researchr.org/publication/HussainF06},
cites = {0},
citedby = {0},
pages = {1277-1284},
booktitle = {Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2006, September 20-22, 2006, Diplomat Hotel Prague, Czech Republic},
publisher = {IEEE},
}