Aliya Hussain, Saurabh Tiwari, Jagadish Suryadevara, Eduard Enoiu. From Modeling to Test Case Generation in the Industrial Embedded System Domain. In Manuel Mazzara, Iulian Ober, Gwen Salaün, editors, Software Technologies: Applications and Foundations - STAF 2018 Collocated Workshops, Toulouse, France, June 25-29, 2018, Revised Selected Papers. Volume 11176 of Lecture Notes in Computer Science, pages 499-505, Springer, 2018. [doi]
@inproceedings{HussainTSE18,
title = {From Modeling to Test Case Generation in the Industrial Embedded System Domain},
author = {Aliya Hussain and Saurabh Tiwari and Jagadish Suryadevara and Eduard Enoiu},
year = {2018},
doi = {10.1007/978-3-030-04771-9_35},
url = {https://doi.org/10.1007/978-3-030-04771-9_35},
researchr = {https://researchr.org/publication/HussainTSE18},
cites = {0},
citedby = {0},
pages = {499-505},
booktitle = {Software Technologies: Applications and Foundations - STAF 2018 Collocated Workshops, Toulouse, France, June 25-29, 2018, Revised Selected Papers},
editor = {Manuel Mazzara and Iulian Ober and Gwen Salaün},
volume = {11176},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-04771-9},
}