From Modeling to Test Case Generation in the Industrial Embedded System Domain

Aliya Hussain, Saurabh Tiwari, Jagadish Suryadevara, Eduard Enoiu. From Modeling to Test Case Generation in the Industrial Embedded System Domain. In Manuel Mazzara, Iulian Ober, Gwen Salaün, editors, Software Technologies: Applications and Foundations - STAF 2018 Collocated Workshops, Toulouse, France, June 25-29, 2018, Revised Selected Papers. Volume 11176 of Lecture Notes in Computer Science, pages 499-505, Springer, 2018. [doi]

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