Fawnizu Azmadi Hussin, Tomokazu Yoneda, Hideo Fujiwara. Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 35-42, IEEE Computer Society, 2007. [doi]
Abstract is missing.