Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang. Dynamic Test Set Generation for Analog Circuits and Systems. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 360-365, IEEE Computer Society, 1998. [doi]
@inproceedings{HuynhKSZ98:0,
title = {Dynamic Test Set Generation for Analog Circuits and Systems},
author = {Sam D. Huynh and Seongwon Kim and Mani Soma and Jinyan Zhang},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/ats/1998/8277/00/82770360abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HuynhKSZ98%3A0},
cites = {0},
citedby = {0},
pages = {360-365},
booktitle = {7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore},
publisher = {IEEE Computer Society},
isbn = {0-8186-8277-9},
}