Testability analysis and multi-frequency ATPG for analog circuits and systems

Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang. Testability analysis and multi-frequency ATPG for analog circuits and systems. In ICCAD. pages 376-383, 1998. [doi]

Authors

Sam D. Huynh

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Seongwon Kim

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Mani Soma

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Jinyan Zhang

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