Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang. Testability analysis and multi-frequency ATPG for analog circuits and systems. In ICCAD. pages 376-383, 1998. [doi]
@inproceedings{HuynhKSZ98,
title = {Testability analysis and multi-frequency ATPG for analog circuits and systems},
author = {Sam D. Huynh and Seongwon Kim and Mani Soma and Jinyan Zhang},
year = {1998},
doi = {10.1145/288548.289057},
url = {http://doi.acm.org/10.1145/288548.289057},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/HuynhKSZ98},
cites = {0},
citedby = {0},
pages = {376-383},
booktitle = {ICCAD},
}