Dung T. Huynh, Lu Tian. The complexity of readiness and failure equivalences for processes. In Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, SPDP 1991, 2-5 December 1991, Dallas, Texas, USA. pages 738-745, IEEE Computer Society, 1991. [doi]
@inproceedings{HuynhT91,
title = {The complexity of readiness and failure equivalences for processes},
author = {Dung T. Huynh and Lu Tian},
year = {1991},
doi = {10.1109/SPDP.1991.218189},
url = {http://dx.doi.org/10.1109/SPDP.1991.218189},
researchr = {https://researchr.org/publication/HuynhT91},
cites = {0},
citedby = {0},
pages = {738-745},
booktitle = {Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, SPDP 1991, 2-5 December 1991, Dallas, Texas, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-2310-1},
}