Sang Hun Hwang, Byung Seol Hwang, Sang-Ho Hwang, Seung Jae Moon, Jong Mo Lee, Byung Seong Bae. Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs. In International Conference on Electronics, Information, and Communication, ICEIC 2024, Taipei, Taiwan, January 28-31, 2024. pages 1-4, IEEE, 2024. [doi]
Abstract is missing.