Ki-Soo Hwang, M. Ray Mercer. Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 5(4):564-572, 1986. [doi]
@article{HwangM86:0,
title = {Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits},
author = {Ki-Soo Hwang and M. Ray Mercer},
year = {1986},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28438&arnumber=1270227&count=22&index=11},
tags = {refinement, testing, constraints, logic},
researchr = {https://researchr.org/publication/HwangM86%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {5},
number = {4},
pages = {564-572},
}