Chulsoon Hwang, Woocheon Park, Dong Gun Kam. Complex permittivity extraction from PCB stripline measurement using recessed probe launch. IEICE Electronic Express, 12(5):20150023, 2015. [doi]
@article{HwangPK15,
title = {Complex permittivity extraction from PCB stripline measurement using recessed probe launch},
author = {Chulsoon Hwang and Woocheon Park and Dong Gun Kam},
year = {2015},
doi = {10.1587/elex.12.20150023},
url = {http://dx.doi.org/10.1587/elex.12.20150023},
researchr = {https://researchr.org/publication/HwangPK15},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {12},
number = {5},
pages = {20150023},
}