J. Iannacci, A. Repchankova, A. Faes, Augusto Tazzoli, Gaudenzio Meneghesso, Gian-Franco Dalla Betta. Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. Microelectronics Reliability, 50(9-11):1599-1603, 2010. [doi]
@article{IannacciRFTMB10,
title = {Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism},
author = {J. Iannacci and A. Repchankova and A. Faes and Augusto Tazzoli and Gaudenzio Meneghesso and Gian-Franco Dalla Betta},
year = {2010},
doi = {10.1016/j.microrel.2010.07.108},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.108},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/IannacciRFTMB10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1599-1603},
}