Luis Ibáñez, Lydia Ng, James C. Gee, Stephen R. Aylward. Registration patterns: the generic framework for image registration of the insight toolkit. In Proceedings of the 2002 IEEE International Symposium on Biomedical Imaging, Ritz-Carlton Hotel, Washington, DC, USA, 7-10 June 2002. pages 345-348, IEEE, 2002. [doi]
Abstract is missing.