Walid Ibrahim, Valeriu Beiu. A Bayesian-Based EDA Tool for Nano-circuits Reliability Calculations. In Alexandre Schmid, Sanjay Goel, Wei Wang, Valeriu Beiu, Sandro Carrara, editors, Nano-Net - 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Volume 20 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, pages 276-284, Springer, 2009. [doi]
Abstract is missing.