A Two-Phase Genetic Algorithm for VLSI Test vector Selection - researchr publication authors

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Walid Ibrahim, Amr El-Chouemi, Hoda H. Amer. A Two-Phase Genetic Algorithm for VLSI Test vector Selection. In IEEE International Conference on Evolutionary Computation, CEC 2006, part of WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006. pages 878-884, IEEE, 2006. [doi]

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