A Two-Phase Genetic Algorithm for VLSI Test vector Selection

Walid Ibrahim, Amr El-Chouemi, Hoda H. Amer. A Two-Phase Genetic Algorithm for VLSI Test vector Selection. In IEEE International Conference on Evolutionary Computation, CEC 2006, part of WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006. pages 878-884, IEEE, 2006. [doi]

@inproceedings{IbrahimEA06,
  title = {A Two-Phase Genetic Algorithm for VLSI Test vector Selection},
  author = {Walid Ibrahim and Amr El-Chouemi and Hoda H. Amer},
  year = {2006},
  doi = {10.1109/CEC.2006.1688404},
  url = {http://dx.doi.org/10.1109/CEC.2006.1688404},
  researchr = {https://researchr.org/publication/IbrahimEA06},
  cites = {0},
  citedby = {0},
  pages = {878-884},
  booktitle = {IEEE International Conference on Evolutionary Computation, CEC 2006, part of WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006},
  publisher = {IEEE},
  isbn = {0-7803-9487-9},
}