DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips - researchr publication authors

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Ahmed M. Y. Ibrahim, Hans G. Kerkhoff. DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-10, IEEE, 2019. [doi]

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