Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions

A. Ibrahim, J. P. Ousten, Richard Lallemand, Zoubir Khatir. Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions. Microelectronics Reliability, 58:204-210, 2016. [doi]

Authors

A. Ibrahim

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J. P. Ousten

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Richard Lallemand

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Zoubir Khatir

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