Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara. On Test Generation with A Limited Number of Tests. In 9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA. pages 12-15, IEEE Computer Society, 1999. [doi]
@inproceedings{IchiharaKK99:0,
title = {On Test Generation with A Limited Number of Tests},
author = {Hideyuki Ichihara and Kozo Kinoshita and Seiji Kajihara},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/glsvlsi/1999/0104/00/01040012abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/IchiharaKK99%3A0},
cites = {0},
citedby = {0},
pages = {12-15},
booktitle = {9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0104-4},
}