Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara. On Test Generation with A Limited Number of Tests. In 9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA. pages 12-15, IEEE Computer Society, 1999. [doi]
Abstract is missing.