Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue. A Practical Threshold Test Generation for Error Tolerant Application. IEICE Transactions, 93-D(10):2776-2782, 2010. [doi]
@article{IchiharaSYI10,
title = {A Practical Threshold Test Generation for Error Tolerant Application},
author = {Hideyuki Ichihara and Kenta Sutoh and Yuki Yoshikawa and Tomoo Inoue},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-d_10_2776},
tags = {testing},
researchr = {https://researchr.org/publication/IchiharaSYI10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-D},
number = {10},
pages = {2776-2782},
}