Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue. A Practical Threshold Test Generation for Error Tolerant Application. IEICE Transactions, 93-D(10):2776-2782, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Practical Approach to Threshold Test Generation for Error Tolerant CircuitsHideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue. ats 2009: 171-176 [doi]
The following publications are possibly variants of this publication: