Sensitivity analysis for SoC performance benchmark against interconnect parasitic resistance and capacitance beyond 10-nm FinFET technology - researchr publication authors

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Motoi Ichihashi, Jia Zeng, Cole Zemke, Irene Lin, Greg Northrop, Ning Jin, Jongwook Kye. Sensitivity analysis for SoC performance benchmark against interconnect parasitic resistance and capacitance beyond 10-nm FinFET technology. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 271-274, IEEE, 2016. [doi]

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