Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma. Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 161-164, IEEE, 2007. [doi]
@inproceedings{IchiyamaIYS07-1,
title = {Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter},
author = {Kiyotaka Ichiyama and Masahiro Ishida and Takahiro J. Yamaguchi and Mani Soma},
year = {2007},
doi = {10.1109/CICC.2007.4405704},
url = {http://dx.doi.org/10.1109/CICC.2007.4405704},
researchr = {https://researchr.org/publication/IchiyamaIYS07-1},
cites = {0},
citedby = {0},
pages = {161-164},
booktitle = {Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1623-3},
}