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V. Iglesias, M. Lanza, A. Bayerl, M. Porti, M. Nafría, X. Aymerich, L. F. Liu, J. F. Kang, G. Bersuker, K. Zhang, Z. Y. Shen. 2/Pt structures. Microelectronics Reliability, 52(9-10):2110-2114, 2012. [doi]
Abstract is missing.