Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method

Hitoshi Iida, Yozo Shimada, Koji Komiyama. Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method. IEEE T. Instrumentation and Measurement, 58(4):1090-1096, 2009. [doi]

Abstract

Abstract is missing.