Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips - researchr publication authors

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Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek. Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 311-316, IEEE Computer Society, 2002. [doi]

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