Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek. Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 311-316, IEEE Computer Society, 2002. [doi]
@inproceedings{IijimaAMB02,
title = {Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips},
author = {Kazuhiko Iijima and Armagan Akar and Charlie McDonald and Dwayne Burek},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250311abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/IijimaAMB02},
cites = {0},
citedby = {0},
pages = {311-316},
booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1825-7},
}