Time Series Analysis of R&D Team Using Patent Information - researchr publication authors

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Yurie Iino, Sachio Hirokawa. Time Series Analysis of R&D Team Using Patent Information. In Juan D. VelÃ¡squez, SebastiÃ¡n A. RÃos, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II. Volume 5712 of Lecture Notes in Computer Science, pages 464-471, Springer, 2009. [doi]

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