Yurie Iino, Sachio Hirokawa. Time Series Analysis of R&D Team Using Patent Information. In Juan D. Velásquez, Sebastián A. RÃos, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II. Volume 5712 of Lecture Notes in Computer Science, pages 464-471, Springer, 2009. [doi]
@inproceedings{IinoH09, title = {Time Series Analysis of R&D Team Using Patent Information}, author = {Yurie Iino and Sachio Hirokawa}, year = {2009}, doi = {10.1007/978-3-642-04592-9_58}, url = {http://dx.doi.org/10.1007/978-3-642-04592-9_58}, tags = {analysis}, researchr = {https://researchr.org/publication/IinoH09}, cites = {0}, citedby = {0}, pages = {464-471}, booktitle = {Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II}, editor = {Juan D. Velásquez and Sebastián A. RÃos and Robert J. Howlett and Lakhmi C. Jain}, volume = {5712}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-04591-2}, }