Jukka Iivarinen, Ari Visa. An adaptive texture and shape based defect classification. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 117-122, IEEE, 1998. [doi]
Abstract is missing.