Timing-Aware Cell Layout Regularity Enhancement for Reduction of Systematic Gate Critical Dimension Variation

Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada. Timing-Aware Cell Layout Regularity Enhancement for Reduction of Systematic Gate Critical Dimension Variation. JNIT, 2(4):1-9, 2011. [doi]

Abstract

Abstract is missing.