Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada. DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 305-308, IEEE Computer Society, 2000. [doi]
@inproceedings{IkedaAA00,
title = {DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path},
author = {Makoto Ikeda and Hideyuki Aoki and Kunihiro Asada},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/isqed/2000/0525/00/05250305abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/IkedaAA00},
cites = {0},
citedby = {0},
pages = {305-308},
booktitle = {1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0525-2},
}