Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada. DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 305-308, IEEE Computer Society, 2000. [doi]
Abstract is missing.