Takuma Ikeda, Kozo Okano, Shinpei Ogata, Shin Nakajima 0001. Fault Localization with DNN-based Test Case Learning and Ablated Execution Traces. In Sungsoo Ahn, Seonah Lee 0001, Sajid Anwar, editors, Proceedings of the 2nd International Workshop on Intelligent Software Engineering co-located with the 30th Asia-Pacific Software Engineering Conference (APSEC 2023), Seoul, South Korea, December 4, 2023. Volume 3655 of CEUR Workshop Proceedings, CEUR-WS.org, 2023. [doi]
Abstract is missing.