Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces

Satoshi Ikehata, David P. Wipf, Yasuyuki Matsushita, Kiyoharu Aizawa. Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces. IEEE Trans. Pattern Anal. Mach. Intell., 36(9):1816-1831, 2014. [doi]

Authors

Satoshi Ikehata

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David P. Wipf

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Yasuyuki Matsushita

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Kiyoharu Aizawa

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