Satoshi Ikehata, David P. Wipf, Yasuyuki Matsushita, Kiyoharu Aizawa. Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces. IEEE Trans. Pattern Anal. Mach. Intell., 36(9):1816-1831, 2014. [doi]
@article{IkehataWMA14,
title = {Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces},
author = {Satoshi Ikehata and David P. Wipf and Yasuyuki Matsushita and Kiyoharu Aizawa},
year = {2014},
doi = {10.1109/TPAMI.2014.2299798},
url = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2014.2299798},
researchr = {https://researchr.org/publication/IkehataWMA14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
volume = {36},
number = {9},
pages = {1816-1831},
}