Stability degradation factors evaluated by phase noise measurement in an optical-microwave frequency link using an optical frequency comb

Hajime Inaba, Shinya Yanagimachi, Feng-Lei Hong, Atsushi Onae, Yasuki Koga, Hirokazu Matsumoto. Stability degradation factors evaluated by phase noise measurement in an optical-microwave frequency link using an optical frequency comb. IEEE T. Instrumentation and Measurement, 54(2):763-766, 2005. [doi]

Abstract

Abstract is missing.