Measurements of LoRa Propagation in Harsh Environment: Numerous NLOS Areas and Ill-Conditioned LoRa Gateway

Kenta Inagaki, Shusuke Narieda, Takeo Fujii, Kenta Umebayashi, Hiroshi Naruse. Measurements of LoRa Propagation in Harsh Environment: Numerous NLOS Areas and Ill-Conditioned LoRa Gateway. In 90th IEEE Vehicular Technology Conference, VTC Fall 2019, Honolulu, HI, USA, September 22-25, 2019. pages 1-5, IEEE, 2019. [doi]

Authors

Kenta Inagaki

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Shusuke Narieda

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Takeo Fujii

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Kenta Umebayashi

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Hiroshi Naruse

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