Kenta Inagaki, Shusuke Narieda, Takeo Fujii, Kenta Umebayashi, Hiroshi Naruse. Measurements of LoRa Propagation in Harsh Environment: Numerous NLOS Areas and Ill-Conditioned LoRa Gateway. In 90th IEEE Vehicular Technology Conference, VTC Fall 2019, Honolulu, HI, USA, September 22-25, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{InagakiNFUN19, title = {Measurements of LoRa Propagation in Harsh Environment: Numerous NLOS Areas and Ill-Conditioned LoRa Gateway}, author = {Kenta Inagaki and Shusuke Narieda and Takeo Fujii and Kenta Umebayashi and Hiroshi Naruse}, year = {2019}, doi = {10.1109/VTCFall.2019.8891540}, url = {https://doi.org/10.1109/VTCFall.2019.8891540}, researchr = {https://researchr.org/publication/InagakiNFUN19}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {90th IEEE Vehicular Technology Conference, VTC Fall 2019, Honolulu, HI, USA, September 22-25, 2019}, publisher = {IEEE}, isbn = {978-1-7281-1220-6}, }