Tsutomu Inamoto, Tomoki Nishino, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi. Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation. In 11th IEEE Global Conference on Consumer Electronics, GCCE 2022, Osaka, Japan, October 18-21, 2022. pages 561-565, IEEE, 2022. [doi]
@inproceedings{InamotoNWHT22,
title = {Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation},
author = {Tsutomu Inamoto and Tomoki Nishino and Senling Wang and Yoshinobu Higami and Hiroshi Takahashi},
year = {2022},
doi = {10.1109/GCCE56475.2022.10014218},
url = {https://doi.org/10.1109/GCCE56475.2022.10014218},
researchr = {https://researchr.org/publication/InamotoNWHT22},
cites = {0},
citedby = {0},
pages = {561-565},
booktitle = {11th IEEE Global Conference on Consumer Electronics, GCCE 2022, Osaka, Japan, October 18-21, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9232-4},
}