Tsutomu Inamoto, Tomoki Nishino, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi. Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation. In 11th IEEE Global Conference on Consumer Electronics, GCCE 2022, Osaka, Japan, October 18-21, 2022. pages 561-565, IEEE, 2022. [doi]
Abstract is missing.