Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization

F. Infante, Philippe Perdu, H. B. Kor, C. L. Gan, Dean Lewis. Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectronics Reliability, 51(9-11):1684-1688, 2011. [doi]

Abstract

Abstract is missing.